Author Details
Ergashov, Y. S.
| Issue | Section | Title | File |
| Vol 62, No 5 (2017) | Physics of Nanostructures | Composition and properties of nanoscale Si structures formed on the CoSi2/Si(111) surface by Ar+ ion bombardment | |
| Vol 63, No 12 (2018) | Solid State Electronics | Structure and Properties of a Bilayer Nanodimensional CoSi2/Si/CoSi2/Si System Obtained by Ion Implantation | |
| Vol 64, No 7 (2019) | Physical Electronics | Escape Depth of Secondary and Photoelectrons from CdTe Films with a Ba Film |