Defect Mode in Microwave Waveguide Bragg Structures with Metal Pins


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

A waveguide Bragg structure containing equidistant cylindrical pins that are galvanically coupled to a wide wall of the waveguide is used to implement frequency response functions characterized by the presence of a band gap. Characteristics of a defect mode of the microwave photonic crystal with a pin element as a defect with an nipin structure with controlled conductivity placed in the capacitive gap are experimentally studied and calculated. Controlled reflectance of a microwave signal with a dynamic range of greater than 50 dB is obtained at the frequency of the defect mode.

About the authors

D. A. Usanov

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

A. V. Skripal’

Chernyshevsky State University

Author for correspondence.
Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

V. N. Posadskii

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

V. S. Tyazhlov

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012

A. V. Baikin

Chernyshevsky State University

Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012


Copyright (c) 2019 Pleiades Publishing, Ltd.

This website uses cookies

You consent to our cookies if you continue to use our website.

About Cookies