Defect Mode in Microwave Waveguide Bragg Structures with Metal Pins
- Authors: Usanov D.A.1, Skripal’ A.V.1, Posadskii V.N.1, Tyazhlov V.S.1, Baikin A.V.1
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Affiliations:
- Chernyshevsky State University
- Issue: Vol 64, No 10 (2019)
- Pages: 1523-1526
- Section: Radiophysics
- URL: https://journals.rcsi.science/1063-7842/article/view/204290
- DOI: https://doi.org/10.1134/S1063784219100232
- ID: 204290
Cite item
Abstract
A waveguide Bragg structure containing equidistant cylindrical pins that are galvanically coupled to a wide wall of the waveguide is used to implement frequency response functions characterized by the presence of a band gap. Characteristics of a defect mode of the microwave photonic crystal with a pin element as a defect with an n–i–p–i–n structure with controlled conductivity placed in the capacitive gap are experimentally studied and calculated. Controlled reflectance of a microwave signal with a dynamic range of greater than 50 dB is obtained at the frequency of the defect mode.
About the authors
D. A. Usanov
Chernyshevsky State University
Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012
A. V. Skripal’
Chernyshevsky State University
Author for correspondence.
Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012
V. N. Posadskii
Chernyshevsky State University
Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012
V. S. Tyazhlov
Chernyshevsky State University
Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012
A. V. Baikin
Chernyshevsky State University
Email: skripala_v@info.sgu.ru
Russian Federation, Saratov, 410012