Synthesis of Hexagonal AlN and GaN Layers on a Si(100) Substrate by Chloride Vapor-Phase Epitaxy


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Abstract

Synthesis of AlN and GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy has been considered. The process includes sulfidizing of the silicon surface, nucleation and growth of an AlN layer, and then formation of a GaN/AlN structure. It has been found that in the case of a (100)Si substrate, GaN nucleates on buffer AlN layers that may have two crystallographic orientations in contrast to a Si(111) substrate, on which a buffer layer may have only one orientation. It has been shown that the treatment of the Si(100) substrate in an aqueous solution of (NH4)2S decreases the FWHM of the rocking curve for GaN(0002) by a factor of 1.5.

About the authors

V. N. Bessolov

Ioffe Institute

Email: lena@triat.ioffe.rssi.ru
Russian Federation, St. Petersburg, 194021

E. V. Gushchina

Ioffe Institute

Email: lena@triat.ioffe.rssi.ru
Russian Federation, St. Petersburg, 194021

E. V. Konenkova

Ioffe Institute

Author for correspondence.
Email: lena@triat.ioffe.rssi.ru
Russian Federation, St. Petersburg, 194021

S. D. Konenkov

St. Petersburg State University

Email: lena@triat.ioffe.rssi.ru
Russian Federation, PeterhofSt. Petersburg, 198504

T. V. L’vova

Ioffe Institute

Email: lena@triat.ioffe.rssi.ru
Russian Federation, St. Petersburg, 194021

V. N. Panteleev

Ioffe Institute

Email: lena@triat.ioffe.rssi.ru
Russian Federation, St. Petersburg, 194021

M. P. Shcheglov

Ioffe Institute

Email: lena@triat.ioffe.rssi.ru
Russian Federation, St. Petersburg, 194021

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