Layer Crystallization in PZT/LNO/Si Heterostructures

Аннотация

A Pb(Zr_0.52Ti_0.48)O₃–LaNiO₃–Si composition and LaNiO₃ thin films are synthesized using chemical solution deposition and studied by transmission electron microscopy. The polycrystalline, porous structure of LaNiO₃ is found to misalign the columnar structure of lead zirconate titanate. The effect that thermal treatment has on the structure and phase composition of lanthanum nickelate is addressed. The morphological features of LaNiO₃ film structure such as its layered character, porosity, and misalignment are observed in samples subjected to annealing at a temperature of 550°C and are more pronounced upon raising the temperature to 800°C.