Автор туралы ақпарат
Egorov, E. V.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 59, № 4 (2017) | Phase Transitions | Structural heteroepitaxy during topochemical transformation of silicon to silicon carbide | |
| Том 61, № 12 (2019) | Surface Physics and Thin Films | Ion-Beam and X-Ray Methods of Elemental Diagnostics of Thin Film Coatings |