Author Details
Petukhov, M. A.
| Issue | Section | Title | File |
| Vol 79, No 14 (2016) | Mathematical Simulation in Nuclear Technologies | Modeling of radiation-induced charge trapping in MOS devices under ionizing irradiation | |
| Vol 82, No 11 (2019) | Mathematical Modeling in Nuclear Technologies | Modeling the Behavior of a MOS Transistor under Fast Neutron and Gamma Irradiation |