Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens


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Аннотация

The results of the first experimental realization of a spectrometer based on the effect of diffraction focusing of X rays by a flat single crystal are discussed. A secondary X-ray source with a relatively high angular divergence and small sizes was formed at the focus of a compound refractive lens having 50 beryllium biconcave elements with a curvature radius of 50 μm. The silicon spectrometer crystal was cut in the form of a wedge of variable thickness, oriented perpendicular to the diffraction plane. The reflection 111 was used for energies of 8.3 and 12 keV. To simulate the experiment, a computer program was developed, which takes into account accurately and for the first time the focusing of radiation by the lens and its subsequent diffraction in the crystal. A calculated curve for a monochromatic beam has made it possible to determine the monochromator spectrum with high resolution from experimental data for a polychromatic beam. It is shown that monochromator resolution increases with an increase in the distance from the compound refractive lens to the crystal.

Авторлар туралы

V. Kohn

National Research Centre “Kurchatov Institute,”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,”

Email: irina@issp.ac.ru
Ресей, Moscow, 123182; Moscow, 119333

I. Smirnova

Institute of Solid State Physics

Хат алмасуға жауапты Автор.
Email: irina@issp.ac.ru
Ресей, Chernogolovka, Moscow oblast, 142432

I. Snigireva

European Synchrotron Radiation Facility

Email: irina@issp.ac.ru
Франция, Grenoble

A. Snigirev

I. Kant Baltic Federal University

Email: irina@issp.ac.ru
Ресей, Kaliningrad

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