Informaçao sobre o Autor
Oreshko, A. P.
Edição | Seção | Título | Arquivo |
Volume 61, Nº 2 (2016) | Diffraction and Scattering of Ionizing Radiations | Study of the amorphization of surface silicon layers implanted by low-energy helium ions | |
Volume 62, Nº 2 (2017) | Diffraction and Scattering of Ionizing Radiations | Complementary study of the internal porous silicon layers formed under high-dose implantation of helium ions | |
Volume 63, Nº 2 (2018) | Diffraction and Scattering of Ionizing Radiations | X-Ray Natural Circular Dichroism in Langasite Crystal at the Ga and La Edges |