Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation


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Resumo

A new scheme of two-beam X-ray diffractometry on the “X-Ray Crystallography and Physical Materials Science” (XCPM) beamline at the Kurchatov Synchrotron Radiation Source (KSRS) has been experimentally investigated. The scheme includes a standard double-crystal monochromator and a narrow slit installed in front of the sample. Measurements have been performed for the Si 111 and 311 reflections in the monochromator and the Si 111 and 220 reflections in the sample crystal. It is shown that this scheme allows one to obtain a near-proper diffraction reflection curve even in the case of symmetric diffraction if the Bragg angle for the monochromator exceeds the Bragg angle for the crystal sample by a factor of 2 or more. The experimental results coincide well with the theory.

Sobre autores

V. Kohn

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”,
Russian Academy of Sciences

Email: ontonic@gmail.com
Rússia, Moscow, 123182; Moscow, 119333

P. Prosekov

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”,
Russian Academy of Sciences

Autor responsável pela correspondência
Email: p.prosekov@gmail.com
Rússia, Moscow, 123182; Moscow, 119333

A. Seregin

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”,
Russian Academy of Sciences

Email: ontonic@gmail.com
Rússia, Moscow, 123182; Moscow, 119333

A. Kulikov

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”,
Russian Academy of Sciences

Autor responsável pela correspondência
Email: ontonic@gmail.com
Rússia, Moscow, 123182; Moscow, 119333

Yu. Pisarevsky

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”,
Russian Academy of Sciences

Email: ontonic@gmail.com
Rússia, Moscow, 123182; Moscow, 119333

A. Blagov

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”,
Russian Academy of Sciences

Email: ontonic@gmail.com
Rússia, Moscow, 123182; Moscow, 119333

M. Kovalchuk

National Research Centre “Kurchatov Institute”; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics”,
Russian Academy of Sciences

Email: ontonic@gmail.com
Rússia, Moscow, 123182; Moscow, 119333

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