作者的详细信息
Myakon’kikh, A. V.
| 期 | 栏目 | 标题 | 文件 |
| 卷 61, 编号 2 (2016) | Diffraction and Scattering of Ionizing Radiations | Study of the amorphization of surface silicon layers implanted by low-energy helium ions | |
| 卷 62, 编号 2 (2017) | Diffraction and Scattering of Ionizing Radiations | Complementary study of the internal porous silicon layers formed under high-dose implantation of helium ions |