Автор туралы ақпарат
Myakon’kikh, A. V.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 61, № 2 (2016) | Diffraction and Scattering of Ionizing Radiations | Study of the amorphization of surface silicon layers implanted by low-energy helium ions | |
| Том 62, № 2 (2017) | Diffraction and Scattering of Ionizing Radiations | Complementary study of the internal porous silicon layers formed under high-dose implantation of helium ions |