Author Details
Myakon’kikh, A. V.
| Issue | Section | Title | File |
| Vol 61, No 2 (2016) | Diffraction and Scattering of Ionizing Radiations | Study of the amorphization of surface silicon layers implanted by low-energy helium ions | |
| Vol 62, No 2 (2017) | Diffraction and Scattering of Ionizing Radiations | Complementary study of the internal porous silicon layers formed under high-dose implantation of helium ions |