Автор туралы ақпарат

Myakon’kikh, A. V.

Шығарылым Бөлім Атауы Файл
Том 61, № 2 (2016) Diffraction and Scattering of Ionizing Radiations Study of the amorphization of surface silicon layers implanted by low-energy helium ions
Том 62, № 2 (2017) Diffraction and Scattering of Ionizing Radiations Complementary study of the internal porous silicon layers formed under high-dose implantation of helium ions