Dielectric Behavior and Conductivity of TlIn1 – xSbxSe2
- Авторлар: Mustafaeva S.N.1, Asadov S.M.2
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Мекемелер:
- Institute of Physics, National Academy of Sciences of Azerbaijan
- Nagiyev Institute of Catalysis and Inorganic Chemistry, National Academy of Sciences of Azerbaijan
- Шығарылым: Том 63, № 7 (2018)
- Беттер: 1163-1166
- Бөлім: Physical Properties of Crystals
- URL: https://journals.rcsi.science/1063-7745/article/view/193468
- DOI: https://doi.org/10.1134/S1063774518070167
- ID: 193468
Дәйексөз келтіру
Аннотация
TlIn1 – xSbxSe2 (x = 0–0.005 Sb) single crystals have been grown by the Bridgman method from polycrystals, which were synthesized from initial high-purity chemical elements (Tl, In, Sb, Se). The influence of antimony dopant on the dielectric properties and ac conductivity of TlIn1 – xSbxSe2 (x = 0–0.005 Sb) single crystals has been investigated. The experimental study of the frequency dispersion of the dielectric coefficients and conductivity of TlIn1 – xSbxSe2 single crystals has revealed the nature of dielectric losses (losses on through conductivity), establish the hopping charge-transfer mechanism, and estimate the parameters of the states localized in the band gap.
Авторлар туралы
S. Mustafaeva
Institute of Physics, National Academy of Sciences of Azerbaijan
Хат алмасуға жауапты Автор.
Email: solmust@gmail.com
Әзірбайжан, Baku, AZ-1143
S. Asadov
Nagiyev Institute of Catalysis and Inorganic Chemistry, National Academy of Sciences of Azerbaijan
Email: solmust@gmail.com
Әзірбайжан, Baku, AZ-1143
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