Experimental Estimate of the Nonlinear Refractive Index of Crystalline ZnSe in the Terahertz Spectral Range

A. N. Tcypkin; S. E. Putilin; M. C. Kulya; M. V. Melnik; A. A. Drozdov; V. G. Bespalov; X.-C. Zhang; R. W. Boyd; S. A. Kozlov

doi:10.3103/S1062873818120237

Experimental Estimate of the Nonlinear Refractive Index of Crystalline ZnSe in the Terahertz Spectral Range

Authors: Tcypkin A.N.¹, Putilin S.E.¹, Kulya M.C.¹, Melnik M.V.¹, Drozdov A.A.¹, Bespalov V.G.¹, Zhang X.¹^,2, Boyd R.W.², Kozlov S.A.¹
Affiliations:
1. ITMO University
2. Institute of Optics, University of Rochester
Issue: Vol 82, No 12 (2018)
Pages: 1547-1549
Section: Article
URL: https://journals.rcsi.science/1062-8738/article/view/186938
DOI: https://doi.org/10.3103/S1062873818120237
ID: 186938

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Abstract

A modification of the Z-scan technique for measuring nonlinear refractive index n₂ in the terahertz spectral region is proposed. Measurements are made at a broadband terahertz radiation intensity of 0.8 × 10⁹ W cm⁻². Coefficient n₂ = 2.5 × 10⁻¹¹ cm² W⁻¹ is estimated for semiconductor crystalline ZnSe.