Author Details
Khomchenko, A. V.
| Issue | Section | Title | File |
| Vol 80, No 4 (2016) | Proceedings of the XI Conference “Lasers and Laser Information Technologies: Fundamental Problems and Applications” | Measurements of absorption spectra of thin films by the waveguide technique | |
| Vol 80, No 4 (2016) | Proceedings of the XI Conference “Lasers and Laser Information Technologies: Fundamental Problems and Applications” | Reflectometry technique for studying metal nanolayers on a substrate |