Email this article Measurements of absorption spectra of thin films by the waveguide technique
- Authors: Khomchenko A.V.1
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Affiliations:
- Belorussian–Russian University
- Issue: Vol 80, No 4 (2016)
- Pages: 426-430
- Section: Proceedings of the XI Conference “Lasers and Laser Information Technologies: Fundamental Problems and Applications”
- URL: https://journals.rcsi.science/1062-8738/article/view/184244
- DOI: https://doi.org/10.3103/S1062873816040183
- ID: 184244
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Abstract
The waveguide technique for measuring the absorption spectra of thin films in spectral range of their transparency is considered. The error of measuring the absorption of a ∼0.1 μm thick film does not exceed 5% at an absorption coefficient of less than 50 cm–1. Capabilities and limitations of the method are discussed.
About the authors
A. V. Khomchenko
Belorussian–Russian University
Author for correspondence.
Email: avkh@mogilev.by
Belarus, Mogilev, 212000
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