Email this article Modeling Transport in a System with Ballistic Focusing of a High Intensity Beam of Metal Ions
- Authors: Koval T.V.1, An T.M.1, Tarakanov V.P.2,3
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Affiliations:
- Tomsk Polytechnic University
- Joint Institute for High Temperatures, Russian Academy of Sciences
- National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
- Issue: Vol 83, No 11 (2019)
- Pages: 1387-1391
- Section: Article
- URL: https://journals.rcsi.science/1062-8738/article/view/187579
- DOI: https://doi.org/10.3103/S1062873819110145
- ID: 187579
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Abstract
Major patterns of ion beam transport in a system with ballistic focusing are studied via numerical modeling. It is shown that the efficiency of transporting a beam of metal ions at 0.66 A and an ion energy of 1–3 keV depends on the voltage bias and plasma density in the beam’s drift space. Incomplete compensation for high-speed ions in the beam transport channel lowers the potential and (under certain conditions) produces a virtual anode. The ion-electron emission of electrons from targets and grid electrodes is an additional mechanism of compensating for the spatial charge of a beam of metal ions.
About the authors
T. V. Koval
Tomsk Polytechnic University
Author for correspondence.
Email: tvkoval@mail.ru
Russian Federation, Tomsk, 634050
Tran My Kim An
Tomsk Polytechnic University
Email: tvkoval@mail.ru
Russian Federation, Tomsk, 634050
V. P. Tarakanov
Joint Institute for High Temperatures, Russian Academy of Sciences; National Research Nuclear University MEPhI (Moscow Engineering Physics Institute)
Email: tvkoval@mail.ru
Russian Federation, Moscow, 125412; Moscow, 115409
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