Describing the Kinetics of Abnormal Grain Growth in Nanocrystalline and Submicrocrystalline Nickel, Based on First-Order Phase Transition Representations
- Авторлар: Aleshin A.N.1
-
Мекемелер:
- Mokerov Institute of Microwave Semiconductor Electronics, Russian Academy of Sciences
- Шығарылым: Том 83, № 10 (2019)
- Беттер: 1195-1202
- Бөлім: Article
- URL: https://journals.rcsi.science/1062-8738/article/view/187545
- DOI: https://doi.org/10.3103/S1062873819100034
- ID: 187545
Дәйексөз келтіру
Аннотация
The growth of grains in nano- and submicrocrystalline nickel produced via equal channel angular pressing is investigated under conditions of non-isothermal annealing using differential scanning calorimetry and transmission electron microscopy. Both types of the material exhibit abnormal grain growth that can be described in terms of the Johnson–Mehl–Avrami formalism.
Авторлар туралы
A. Aleshin
Mokerov Institute of Microwave Semiconductor Electronics, Russian Academy of Sciences
Хат алмасуға жауапты Автор.
Email: a.n.aleshin@mail.ru
Ресей, Moscow, 117105
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