Determining the refractive index of a laser diode waveguide from the measured radiation pattern

V. V. Bliznyuk; O. I. Koval; V. A. Parshin; A. G. Rzhanov; A. E. Tarasov

doi:10.3103/S1062873818010057

Determining the refractive index of a laser diode waveguide from the measured radiation pattern

Authors: Bliznyuk V.V.¹, Koval O.I.¹, Parshin V.A.¹, Rzhanov A.G.², Tarasov A.E.¹
Affiliations:
1. National Research University Moscow Power Engineering Institute
2. Faculty of Physics
Issue: Vol 82, No 1 (2018)
Pages: 6-8
Section: Proceedings of the XVI A.P. Sukhorukov National Seminar “The Physics and Applications of Microwaves” (“Waves-2017”)
URL: https://journals.rcsi.science/1062-8738/article/view/185268
DOI: https://doi.org/10.3103/S1062873818010057
ID: 185268

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Abstract

It is shown that to find the transverse refractive-index profile of a semiconductor laser waveguide, it is sufficient to know the angle of the device’s radiation divergence and two values of the function describing the directional radiation pattern. A calculation technique is proposed and its use in the diagnostics of laser diode degradation is discussed.