Modes of a hybrid nanoscope for conducting comprehensive investigations of nanostructured materials

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Abstract

A hybrid nanoscope is developed for complex investigations of the surfaces and structures of micro- and nanoscale objects. It economically combines the best features of spectral detectors and electronic, X-ray, probe, and optical microscopes. One part of an object can be investigated using different combinations of light, electron beams, X-rays, scanning probes, and spectral detectors.

About the authors

V. D. Gelever

Moscow State Technical University of Radio Engineering, Electronics, and Automation

Author for correspondence.
Email: gelgan@yandex.ru
Russian Federation, Moscow, 105275

E. Yu. Usachev

Moscow State Technical University of Radio Engineering, Electronics, and Automation

Email: gelgan@yandex.ru
Russian Federation, Moscow, 105275

A. A. Manushkin

Moscow State Technical University of Radio Engineering, Electronics, and Automation

Email: gelgan@yandex.ru
Russian Federation, Moscow, 105275

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