电邮这篇文章 Benchmarking the Reliability of the Consignments of Semiconductor Articles Using Electrostatic Discharges
- 作者: Gorlov M.I.1, Strogonov A.V.1, Vinokurov A.A.1
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隶属关系:
- Voronezh State Technical University
- 期: 卷 54, 编号 6 (2018)
- 页面: 455-461
- 栏目: Electrical Methods
- URL: https://journals.rcsi.science/1061-8309/article/view/181719
- DOI: https://doi.org/10.1134/S1061830918060025
- ID: 181719
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详细
Five methods that have been developed by the authors since 2006 for benchmarking the reliability of semiconductor articles using electrostatic discharges are described.
作者简介
M. Gorlov
Voronezh State Technical University
编辑信件的主要联系方式.
Email: m-gorlov@inbox.ru
俄罗斯联邦, Voronezh, 394026
A. Strogonov
Voronezh State Technical University
Email: m-gorlov@inbox.ru
俄罗斯联邦, Voronezh, 394026
A. Vinokurov
Voronezh State Technical University
Email: m-gorlov@inbox.ru
俄罗斯联邦, Voronezh, 394026
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