A Giant Increase in the Electrical Conductivity of the High-Resistivity Film MoS2 Semiconductor under Continuous Proton Injection


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Abstract

The highly reproducible effect of a giant (10 000-fold) increase in the electrical conductivity of a film sample of a high-resistivity MoS2 semiconductor with a layered structure under continuous proton injection in dynamic equilibrium conditions is reported for the first time. The effect disappears when the process of proton injection is interrupted. The potential to control the composition and the properties of materials by doping them with charge carriers of different signs, masses, and energies (as a complement to traditional chemical doping) is noted.

About the authors

G. S. Burkhanov

Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences

Email: lachenck@imet.ac.ru
Russian Federation, Moscow, 119991

S. A. Lachenkov

Baikov Institute of Metallurgy and Materials Science, Russian Academy of Sciences

Author for correspondence.
Email: lachenck@imet.ac.ru
Russian Federation, Moscow, 119991

M. A. Kononov

Prokhorov General Physics Institute, Russian Academy
of Sciences

Email: lachenck@imet.ac.ru
Russian Federation, Moscow, 119991

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