Low-Period Multilayered Ti/Ni  x  Mo  y   Films with Variable Quasi-Homogeneous Structure for Neutron Reflectometry

M. V. Avdeev; Авдеев М. В.; I. V. Gapon; Гапон И. В.; D. Merkel; Меркель Д.; M. Yerdauletov; Ердаулетов М.; D. M. Djanseitov; Джансейтов Д. М.; T. V. Tropin; Тропин Т. В.

doi:10.31857/S1028096023080046

Low-Period Multilayered Ti/Ni_xMo_y Films with Variable Quasi-Homogeneous Structure for Neutron Reflectometry

Авторлар: Avdeev M.¹, Gapon I.², Merkel D.², Yerdauletov M.¹^,3^,4, Djanseitov D.³^,4, Tropin T.¹
Мекемелер:
1. Frank Laboratory of Neutron Physics, Joint Institute for Nuclear Research
2. Center for Energy Research
3. Institute of Nuclear Physics, Ministry of Energy of the Republic of Kazakhstan
4. L.N. Gumilyov Eurasian National University
Шығарылым: № 8 (2023)
Беттер: 46-51
Бөлім: Articles
URL: https://journals.rcsi.science/1028-0960/article/view/137796
DOI: https://doi.org/10.31857/S1028096023080046
EDN: https://elibrary.ru/OBLHMB
ID: 137796

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Аннотация

The results of testing multilayered Ti/Ni_xMo_y heterostructures with a low period of sublayers are presented regarding the practical applicability of a quasi-homogeneous approach with varying the effective scattering length density of thin (thickness <100 nm) films in experiments on specular neutron reflectometry with a changing interface. By changing the effective scattering length density of the films, it proposed to vary the contrast between the components of complex interfaces, thus increasing the sensitivity and information content of the in situ neutron experiment. Structures with different ratios of Ni_xMo_y and Ti sublayer thicknesses were synthesized by magnetron sputtering. Based on the analysis of neutron specular reflectivity curves, a conclusion is made about the applicability of the homogeneous approximation.

Негізгі сөздер

neutron reflectometry, thin films, multilayered structures, in situ experiments.

Әдебиет тізімі

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