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Complex Diagnostics of Silicon-on-Insulator Layers after Ion Implantation and Annealing
Yunin P.A., Drozdov M.N., Novikov A.V., Shmagin V.B., Demidov E.V., Mikhailov A.N., Tetelbaum D.I., Belov A.I.
Measurements of the Characteristics of Fine Grain Graphite Used as a First Wall Material for the T-15MD TOKAMAK
Begrambekov L.B., Puntakov N.A., Ayrapetov A.A., Grunin A.V., Dovganyuk S.S., Zakharov .M., Savvin N.O., Grashin S.A., Arkhipov I.I.
Effect of Annealing Conditions on the Formation of a Nanocrystalline Phase in TiOx Films
Nezhdanov A.V., Baratta M., De Filpo G., Markelov A.S., Andrianov A.I., Pavlov D.A., Ershov A.V., Skrylev A.A., Vinogradova L.M., Shestakov D.V., Zhukov A.O., Mashin A.I.
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