Study of SiO2 films implanted with 64Zn+ ions and oxidized at elevated temperatures
- Authors: Privezentsev V.V.1, Sergeev A.P.1, Firsov A.A.1, Kulikauskas V.S.2, Zatekin V.V.2, Kirilenko E.P.3, Goryachev A.V.3, Kovalskiy V.A.4
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Affiliations:
- FSC “Scientific Research Institute for System Analysis RAS”
- Lomonosov Moscow State University
- Institute of Nanotechnology Microelectronics RAS
- Institute of Microelectronics Technology RAS
- Issue: No 4 (2024)
- Pages: 62–67
- Section: Articles
- URL: https://journals.rcsi.science/1028-0960/article/view/261077
- DOI: https://doi.org/10.31857/S1028096024040082
- EDN: https://elibrary.ru/GIWFUR
- ID: 261077
Cite item
Abstract
The results of studying SiO2 films implanted with 64Zn ions with a dose of 5 × 1016 cm–2 at energies of 20 and 120 keV and isochronously oxidized for 1 h at temperatures from 400 to 800°C with a step of 100°C are presented. The profiles of Zn and its oxide were studied using Rutherford backscattering and time-of-flight secondary ion mass spectrometry. The chemical state of zinc and the phase composition of the film were determined by Auger electron spectroscopy and Raman scattering. It was found that after implantation, the zinc distribution had two maxima at depths of 20 and 85 nm, and after annealing at 700°C there was a broadened maximum at a depth of 45 nm. After implantation, a mixture of Zn and ZnO phases was formed in the sample. After annealing at 700°C, only the ZnO phase was formed in the sample, the distribution profile of which had a broadened peak at 45 nm.
Full Text
About the authors
V. V. Privezentsev
FSC “Scientific Research Institute for System Analysis RAS”
Author for correspondence.
Email: v.privezentsev@mail.ru
Russian Federation, 117218, Moscow
A. P. Sergeev
FSC “Scientific Research Institute for System Analysis RAS”
Email: v.privezentsev@mail.ru
Russian Federation, 117218, Moscow
A. A. Firsov
FSC “Scientific Research Institute for System Analysis RAS”
Email: v.privezentsev@mail.ru
Russian Federation, 117218, Moscow
V. S. Kulikauskas
Lomonosov Moscow State University
Email: v.privezentsev@mail.ru
Skobeltsyn Institute of Nuclear Physics
Russian Federation, 119991, MoscowV. V. Zatekin
Lomonosov Moscow State University
Email: v.privezentsev@mail.ru
Skobeltsyn Institute of Nuclear Physics
Russian Federation, 119991, MoscowE. P. Kirilenko
Institute of Nanotechnology Microelectronics RAS
Email: v.privezentsev@mail.ru
Russian Federation, 119991, Moscow
A. V. Goryachev
Institute of Nanotechnology Microelectronics RAS
Email: v.privezentsev@mail.ru
Russian Federation, 119991, Moscow
V. A. Kovalskiy
Institute of Microelectronics Technology RAS
Email: v.privezentsev@mail.ru
Russian Federation, 142432, Chernogolovka
References
- Yang J.J., Strukov D.B., Stewart D.R. // Nature Nanotechnol. 2013. V. 8. P. 14. https://www.doi.org/10.1038/nnano.2012.240
- Tripathi S.K., Kaur R., Rani M. // Solid State Phenom. 2015. V. 222. P. 67. https://www.doi.org/10.4028/www.scientific.net/SSP.222.67
- Advances in Memristors, Memristive Devices and Systems. Series “Studies in Computational Intelligence”. Vol. 701. / Ed. Vaidyanathan S., Volos C. Springer, 2017. 511 p. https://www.doi.org/10.1007/978-3-319-51724-7
- Chang T.-C., Chang K.-C., Tsai T.-M., Chu T.-J., Sze S.M. // Mater. Today. 2016. V. 19. Iss. 5. P. 254. https://www.doi.org/10.1016/j.mattod.2015.11.009
- Mehonic C.C., Shluger A.L., Gao D., Valov I., Miranda E., Ielmini D., Bricalli A., Ambrosi E., Li C., Yang J.J., Xia Q., Kenyon A.J. // Adv. Mater. 2018. V. 30. Iss. 43. P. 1801187. https://www.doi.org/10.1002/adma.201801187
- Ilyas N., Li C., Wang J., Jiang X., Fu H., Liu F., Gu D., Jiang Y., Li J. // Phys. Chem. Lett. 2022. V. 13. № 3. P. 884. https://www.doi.org/10.1021/acs.jpclett.1c03912
- Litton С.W., Collins T.C., Reynolds D.S. Zinc Oxide Material for Electronic and Optoelectronic Device Application. Chichester: Wiley, 2011. 363 p. https://www.doi.org/10.1002/9781119991038
- Chu S., Olmedo M., Yang Zh., Kong J., Liu J. // Appl. Phys. Lett. 2008. V. 93. P. 181106. https://www.doi.org/10.1063/1.3012579
- Jiang C.Y., Sun X.W., Lo G.Q., Kwong D.L., Wang J.X. // Appl. Phys. Lett. 2007. V. 90. P. 263501. https://www.doi.org/10.1063/1.2751588
- Huang J.S., Yen W.C., Lin S.M., Lee C.Y., Wu J., Wang Z.M., Chin T.S., Chueh Y.L. // J. Mater. Chem. C. 2014. V. 2. P. 4401. https://www.doi.org/10.1039/C3TC32166E
- Tsai T.M., Chang K.C., Chang T.C., Syu Y.E., Liao K.H., Tseng B.H., Sze S.M. // Appl. Phys. Lett. 2012. V. 101. Iss. 11. P. 112906. https://www.doi.org/10.1063/1.4750235
- Chang K.C., Tsai T.M., Chang T.C., Wu H.H., Chen J.H., Syu Y.E., Chang G., Chu T.J., Liu G.R., Su Y.T., Chen M.C., Pan J.H., Chen J.Y., Tung C.W., Huang H.C., Tai Y.H., Gan D.S., Sze S.M. // IEEE Elecron. Dev. Lett. 2013. V. 34. № 3. P. 399. https://www.doi.org/10.1109/LED.2013.2241725
- Chang K.C., Tsai T.M., Chang T.C., Wu H.H., Chen K.H., Chen J.H., Young T.F., Chu T.J., Chen J.Y., Pan C.H., Chen J.Y., Tung C.W., Huang H.C., Tai Y.H., Gan D.S., Sze S.M. // IEEE Electron. Dev. Lett. 2013. V. 34. № 4. P. 511. https://www.doi.org/10.1109/LED.2013.2248075
- Zhang R., Tsai T.M., Chang T.C., Chang K.C., Chen K.H., Lou J.C., Young T.F., Chen J.H., Huang S.Y., Chen M.C., Shih C.C., Chen H.L., Pan J.H., Tung C.W., Syu Y.E., Sze S.M. // J. Appl. Phys. 2013. V. 114. P. 234501. http://dx.doi.org/10.1063/1.4843695
- Ziegler J.F., Biersack J.P. SRIM 2008 (http://www.srim.org).
- Hofmann S. Auger- and X-Ray Photoelectron Spectroscopy in Material Science. Berlin–Heidelberg: Springer–Verlag, 2013. 528 p. https://www.doi.org/10.1007/978-3-642-27381-0
- Анализ поверхности методами оже- и рентгеновской фотоэлектронной спектроскопии / Ред. Бриггс Д., Сих М.П. М.: Мир, 1987. 598 c.
- Монахова Ю.Б., Муштакова С.П. // Журн. аналитической химии. 2012. Т. 67. № 12. C. 1044.
- Huang Y., Liu M., Li Z., Zeng Y., Liu S. // Mater. Sci. Engin. B. 2003. V. 97. Iss. 2. P. 111. https://www.doi.org/10.1016/S0921-5107(02)00396-3
- Garcia-Sotelo A., Avila-Meza M., Melendez-Lira M.A., Fernandez-Muñoz J.L., Zelaya-Ange O. // Mater. Res. 2019. V. 22. Iss. 4. P. e201901059. https://www.doi.org/10.1590/1980-5373-MR-2019-0105
- Torchynska T., El Filali B., Polupan G., Shcherbyna L. // MRS Adv. 2019. V. 2. P. 1. https://www.doi.org/10.1557/adv.2017.344
- Chen S.J., Liu Y.C., Lu Y.M., Zhang J.Y., Shen D.Z., Fan X.W. // J. Cryst. Growth. 2006. V. 289. P. 55. https://www.doi.org/10.1016/j.jcrysgro.2005.10.137