Structural features of poly(p-xylylene)−cadmium sulphide nanocomposite films

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Abstract

The structure and chemical composition of nanocomposite films based on poly(p-xylylene) with cadmium sulphide (CdS) as a filler were studied by X-ray diffraction and IR-spectroscopy. The films were synthesized by co-deposition of p-xylylene monomer and CdS vapors on quartz and silicon substrates, had a thickness of ~0.2 and ~1.5 µm and contained 5–90 vol. % of CdS. The effect of filler content and film thickness on polymer matrix and filler structure was demonstrated. Differences in the chemical compositions of films with thicknesses of ~0.2 and ~1.5 µm were revealed, caused by their partial oxidation upon contact with air after synthesis. The possible influence of hydroxyl groups on the formation of CdS crystalline structures in films was discussed. A correlation was established between structural transformations upon changes in the CdS content with the previously obtained dependences of dark conductivity and photoconductivity for films with a thickness of ~0.2 μm.

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About the authors

O. P. Ivanova

Emanuel Institute of Biochemical Physics RAS

Author for correspondence.
Email: olga@deom.chph.ras.ru
Russian Federation, 119334, Moscow

A. V. Krivandin

Emanuel Institute of Biochemical Physics RAS

Email: olga@deom.chph.ras.ru
Russian Federation, 119334, Moscow

A. A. Piryazev

Institute of Problems of Chemical Physics RAS

Email: olga@deom.chph.ras.ru
Russian Federation, 142334, Chernogolovka

S. A. Zav’yalov

National Research Center Kurchatov Institute

Email: olga@deom.chph.ras.ru
Russian Federation, 123182, Moscow

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Supplementary files

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2. Fig. 1. Diffraction patterns of CdS films: with a wurtzite-type structure (1); X-ray amorphous (2); with a SPU structure (3). Experimental intensity 2 is increased threefold. Diffraction patterns 1, 2 are shifted upward along the ordinate axis.

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3. Fig. 2. Diffraction patterns of PPX films: amorphous-crystalline (1); X-ray amorphous (2). Diffraction pattern 1 is shifted upward along the ordinate axis.

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4. Fig. 3. Diffraction patterns of PPX–CdS nanocomposite films with a thickness of ~1.5 μm, obtained on a synchrotron diffractometer (left) and on a laboratory diffractometer with a coordinate detector (right), CdS filler content: a – 5; b – 10; c – 20; g – 30; d – 40; f – 50; g – 60; h – 70; i – 80; j – 90 vol.%.

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5. Fig. 4. Diffraction patterns of PPX–CdS nanocomposite films with a thickness of ~0.2 μm, obtained on a laboratory diffractometer with a coordinate detector (a–g) and a photo method using an X-ray camera with point collimation of the X-ray beam (d), CdS filler content: a – 8; b – 10.5; c – 11; d – 13.5; d – 10.5 vol.%.

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6. Fig. 5. IR spectra of PPX–CdS nanocomposite films with a thickness of ~1.5 μm and a CdS filler concentration of: 1 − 0; 2 − 5; 3 − 10; 4 − 30; 5 − 50; 6 − 60; 7 – 70 vol.%.

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7. Fig. 6. IR spectra of PPX–CdS nanocomposite films with a thickness of ~0.2 μm and a CdS filler concentration of: 1 − 0; 2 − 8; 3 − 10; 4 − 10.5%.

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