Use of Special Devices for X-Ray Interferometric Investigation of Structural Imperfections in Single Crystals - PDF (Russian)
Copyright (c) 2023 Г.Р. Дрмеян, М.С. Василян
Copyright (c) 2023 Г.Р. Дрмеян, М.С. Василян
ISSN 1028-0960 (Print)
ISSN 3034-5731 (Online)
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Keywords
X-ray diffraction
X-ray phase analysis
X-ray photoelectron spectroscopy
atomic force microscopy
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
transmission electron microscopy
zinc oxide
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Keywords
X-ray diffraction
X-ray phase analysis
X-ray photoelectron spectroscopy
atomic force microscopy
electron microscopy
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface morphology
synchrotron radiation
thin films
transmission electron microscopy
zinc oxide
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Copyright (c) 2023 Г.Р. Дрмеян, М.С. Василян