Application of nanostructured silver film in multilayer contact system of Ti/Mo/Ag silicon photoconverters


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

In this article we have synthesized multilayer contact systems Ti/Ag and Ti/Mo/Ag with nanostructured silver films using two vacuum methods, namely the method of electron-beam evaporation and HF magnetron sputtering. Using the data of atomic force microscopy, X-ray diffraction and mass spectroscopy of the secondary neutrals in the paper we have investigated the influence of the application method and of the annealing conditions on the grain formation processes in silver thin films and mass transfer between the metal layers of the contact system. The decrease of surface resistivity of the developed contacts and, respectively, the increase of short-circuit current of the heterojunction silicon solar cells have been determined.

Авторлар туралы

V. Koval

National Technical University of Ukraine “Kyiv Polytechnic Institute”

Хат алмасуға жауапты Автор.
Email: pvlab_kpi@ukr.net
Украина, Kyiv

A. Ivashchuk

National Technical University of Ukraine “Kyiv Polytechnic Institute”

Email: pvlab_kpi@ukr.net
Украина, Kyiv

Y. Yakymenko

National Technical University of Ukraine “Kyiv Polytechnic Institute”

Email: pvlab_kpi@ukr.net
Украина, Kyiv

M. Dusheyko

National Technical University of Ukraine “Kyiv Polytechnic Institute”

Email: pvlab_kpi@ukr.net
Украина, Kyiv

Yu. Yasievich

National Technical University of Ukraine “Kyiv Polytechnic Institute”

Email: pvlab_kpi@ukr.net
Украина, Kyiv

G. Khrypunov

National Technical University “Kharkiv Polytechnic Institute”

Email: pvlab_kpi@ukr.net
Украина, Kharkiv

Ye. Sokol

National Technical University “Kharkiv Polytechnic Institute”

Email: pvlab_kpi@ukr.net
Украина, Kharkiv


© Allerton Press, Inc., 2016

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