Technique for Contactless Measurements of the Electromagnetic Parameters of Thin Films and Nanomaterials
- 作者: Skvortsov B.1, Borminskii S.1, Solntseva A.1
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隶属关系:
- Samara State Aerospace University (National Research University)
- 期: 卷 59, 编号 6 (2016)
- 页面: 663-670
- 栏目: Article
- URL: https://journals.rcsi.science/0543-1972/article/view/245398
- DOI: https://doi.org/10.1007/s11018-016-1027-9
- ID: 245398
如何引用文章
详细
A contactless operational method for measuring the electromagnetic parameters of thin films and nanomaterials is developed. It is based on probing the monitored surface with an electromagnetic signal. The measurement procedure is described mathematically. A method is presented for calculating the unknown parameters based on measuring the amplitude and phase of the reflected signal at different frequencies and solving a system of algebraic equations.
作者简介
B. Skvortsov
Samara State Aerospace University (National Research University)
Email: als063@mail.ru
俄罗斯联邦, Samara
S. Borminskii
Samara State Aerospace University (National Research University)
Email: als063@mail.ru
俄罗斯联邦, Samara
A. Solntseva
Samara State Aerospace University (National Research University)
编辑信件的主要联系方式.
Email: als063@mail.ru
俄罗斯联邦, Samara