Отправить статью по E-mail Technique for Contactless Measurements of the Electromagnetic Parameters of Thin Films and Nanomaterials
- Авторы: Skvortsov B.1, Borminskii S.1, Solntseva A.1
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Учреждения:
- Samara State Aerospace University (National Research University)
- Выпуск: Том 59, № 6 (2016)
- Страницы: 663-670
- Раздел: Article
- URL: https://journals.rcsi.science/0543-1972/article/view/245398
- DOI: https://doi.org/10.1007/s11018-016-1027-9
- ID: 245398
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Аннотация
A contactless operational method for measuring the electromagnetic parameters of thin films and nanomaterials is developed. It is based on probing the monitored surface with an electromagnetic signal. The measurement procedure is described mathematically. A method is presented for calculating the unknown parameters based on measuring the amplitude and phase of the reflected signal at different frequencies and solving a system of algebraic equations.
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Об авторах
B. Skvortsov
Samara State Aerospace University (National Research University)
Email: als063@mail.ru
Россия, Samara
S. Borminskii
Samara State Aerospace University (National Research University)
Email: als063@mail.ru
Россия, Samara
A. Solntseva
Samara State Aerospace University (National Research University)
Автор, ответственный за переписку.
Email: als063@mail.ru
Россия, Samara
