The Systematic Error of Measurement of the Exponent of the Frequency Dependence of the Spectrum of Low-Frequency Noise


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Resumo

The features of measurements of the parameters of low-frequency noise with a spectrum of the form 1/fγ of electronic components are considered. Expressions for the systematic error in determining the exponent γ from the results of single measurements of the spectral power density of the noise by a direct estimate at two frequencies, taking thermal and shot noise of the monitored article into account, are obtained and analyzed. Recommendations on minimizing the total error in determining γ are given.

Sobre autores

V. Sergeev

Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences; Ulyanovsk State Technical University

Autor responsável pela correspondência
Email: sva@ulstu.ru
Rússia, Ulyanovsk; Ulyanovsk

S. Rezchikov

Ulyanovsk State Technical University

Email: sva@ulstu.ru
Rússia, Ulyanovsk


Declaração de direitos autorais © Springer Science+Business Media New York, 2015

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