The Systematic Error of Measurement of the Exponent of the Frequency Dependence of the Spectrum of Low-Frequency Noise


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

The features of measurements of the parameters of low-frequency noise with a spectrum of the form 1/fγ of electronic components are considered. Expressions for the systematic error in determining the exponent γ from the results of single measurements of the spectral power density of the noise by a direct estimate at two frequencies, taking thermal and shot noise of the monitored article into account, are obtained and analyzed. Recommendations on minimizing the total error in determining γ are given.

About the authors

V. A. Sergeev

Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences; Ulyanovsk State Technical University

Author for correspondence.
Email: sva@ulstu.ru
Russian Federation, Ulyanovsk; Ulyanovsk

S. E. Rezchikov

Ulyanovsk State Technical University

Email: sva@ulstu.ru
Russian Federation, Ulyanovsk


Copyright (c) 2015 Springer Science+Business Media New York

This website uses cookies

You consent to our cookies if you continue to use our website.

About Cookies