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Measurement of the Reflectivity of Radiation Absorbent Materials by Pulsed Spectroscopy


Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

Results from an experimental study of the reflectivity of radiation adsorbent materials probed by ultrashort electromagnetic radiation are presented. Ultra wide-band pulsed microwave spectroscopic methods are used. Measurements of reflectivity by traditional narrow band and ultra-wide band techniques are compared.

Авторлар туралы

V. Turkin

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: sukhov@vniiofi.ru
Ресей, Moscow

K. Sakharov

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: sukhov@vniiofi.ru
Ресей, Moscow

O. Mikheev

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: sukhov@vniiofi.ru
Ресей, Moscow

A. Sukhov

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Хат алмасуға жауапты Автор.
Email: sukhov@vniiofi.ru
Ресей, Moscow

A. Aleshko

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: sukhov@vniiofi.ru
Ресей, Moscow

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