Measuring Complex for the Diagnostics of the Quality of Light–Emitting Heterostructures According to Photoelectric and Optical Responses Under Local Photoexcitation
- Authors: Sergeev V.А.1, Vasin S.V.1, Frolov I.V.1, Radaev О.А.1
-
Affiliations:
- Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
- Issue: Vol 61, No 9 (2018)
- Pages: 914-920
- Section: Article
- URL: https://journals.rcsi.science/0543-1972/article/view/246597
- DOI: https://doi.org/10.1007/s11018-018-1524-0
- ID: 246597
Cite item
Abstract
We propose an automated measuring complex for the diagnostics of the lateral homogeneity of semiconductor heterostructures by measurements and analysis of the photoelectric and optic responses to their local photoexcitation in static and dynamic modes. The electronic-mechanical and optical positioning systems guarantee the illumination of local region of the investigated structure with a minimum diameter of the spot of 14 μm and a positioning accuracy of 10 μm. It is shown that the measuring complex can be used for the diagnostics of the quality of light-emitting heterostructures, transistors, solar cells, and photodiodes.
About the authors
V. А. Sergeev
Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Author for correspondence.
Email: ufire@mv.ru
Russian Federation, Ulyanovsk
S. V. Vasin
Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Email: ufire@mv.ru
Russian Federation, Ulyanovsk
I. V. Frolov
Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Email: ufire@mv.ru
Russian Federation, Ulyanovsk
О. А. Radaev
Ulyanovsk Branch, Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences
Email: ufire@mv.ru
Russian Federation, Ulyanovsk