Measurement of the Fluctuation Rejection Ratio by Linear Voltage Stabilizers

Abstract

Measurement of the frequency dependence of the fluctuation rejection ratio produced by the microcircuits of linear voltage stabilizers by means of a modern oscillograph and generator without the use of special expensive equipment is investigated. The effect of the amplitude of the sinusoidal probe voltage to induce distortion of the form of the output signal of the stabilizer at different frequencies is studied. Questions related to the possible influence of the automatic scanning options and the lay-out and configuration of the printed board as well as the types, ratings, and assembly of the capacitors on the measurement results are considered.