A New Technique for Intelligent Constructing Exact γ-content Tolerance Limits with Expected (1 – α)-confidence on Future Outcomes in the Weibull Case Using Complete or Type II Censored Data
- 作者: Nechval N.A.1, Nechval K.N.2, Berzins G.1
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隶属关系:
- BVEF Research Institute, University of Latvia
- Aviation Department, Transport and Telecommunication Institute
- 期: 卷 52, 编号 6 (2018)
- 页面: 476-488
- 栏目: Article
- URL: https://journals.rcsi.science/0146-4116/article/view/175567
- DOI: https://doi.org/10.3103/S0146411618060081
- ID: 175567
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详细
The logical purpose for a statistical tolerance limit is to predict future outcomes for some (say, production) process. The coverage value γ is the percentage of the future process outcomes to be captured by the prediction, and the confidence level (1 – α) is the proportion of the time we hope to capture that percentage γ. Tolerance limits of the type mentioned above are considered in this paper, which presents a new technique for constructing exact statistical (lower and upper) tolerance limits on outcomes (for example, on order statistics) in future samples. Attention is restricted to the two-parameter Weibull distribution under parametric uncertainty. The technique used here emphasizes pivotal quantities relevant for obtaining tolerance factors and is applicable whenever the statistical problem is invariant under a group of transformations that acts transitively on the parameter space. It does not require the construction of any tables and is applicable whether the experimental data are complete or Type II censored. The exact tolerance limits on order statistics associated with sampling from underlying distributions can be found easily and quickly making tables, simulation, Monte Carlo estimated percentiles, special computer programs, and approximation unnecessary. The proposed technique is based on a probability transformation and pivotal quantity averaging. It is conceptually simple and easy to use. The discussion is restricted to one-sided tolerance limits. Finally, we give numerical examples, where the proposed analytical methodology is illustrated in terms of the two-parameter Weibull distribution. Applications to other log-location-scale distributions could follow directly.
作者简介
N. Nechval
BVEF Research Institute, University of Latvia
编辑信件的主要联系方式.
Email: nechval@junik.lv
拉脱维亚, Riga, LV-1050
K. Nechval
Aviation Department, Transport and Telecommunication Institute
Email: nechval@junik.lv
拉脱维亚, Riga, LV-1019
G. Berzins
BVEF Research Institute, University of Latvia
Email: nechval@junik.lv
拉脱维亚, Riga, LV-1050
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