Automatic Control and Computer Sciences
ISSN 0146-4116 (Print)
ISSN 1558-108X (Online)
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Keywords
Big Data
CRC
VANET
asymptotics
authentication
cloud computing
cybersecurity
deep learning
delay
digital production
error probability
genetic algorithm
information security
large parameter
machine learning
neural network
relaxation oscillations
security
self-similarity
stability
verification
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Keywords
Big Data
CRC
VANET
asymptotics
authentication
cloud computing
cybersecurity
deep learning
delay
digital production
error probability
genetic algorithm
information security
large parameter
machine learning
neural network
relaxation oscillations
security
self-similarity
stability
verification
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van der Aalst, W. M. P.
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Vol 51, No 7 (2017)
Article
Using Event Logs for Local Correction of Process Models
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