Talbot and Talbot–Lau X-ray interferometers

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Abstract

The operating principles and capabilities of X-ray grating interferometry are described using Talbot and Talbot–Lau interferometers as examples. Various types of diffraction gratings and methods for their production are described. Methods for collecting data in radiography and computed tomography, the origin of artifacts in X-ray images, and methods of suppressing them are considered. Particular attention is devoted to dark-field X-ray imaging and its application in medicine.

About the authors

Valentin Viktorovich Lider

Institute of Cristallography Russian Academy of Sciences

Email: lider@ns.crys.ras.ru
Candidate of physico-mathematical sciences, Head Scientist Researcher

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Используя сайт https://journals.rcsi.science, я (далее – «Пользователь» или «Субъект персональных данных») даю согласие на обработку персональных данных на этом сайте (текст Согласия) и на обработку персональных данных с помощью сервиса «Яндекс.Метрика» (текст Согласия).