The Determining Role of the (HF2)– Ion in the Formation of Pores in Silicon in Its Electrochemical Etching with Hydrofluoric Acid Solutions
- Авторлар: Abramova E.N.1, Khort A.M.1, Yakovenko A.G.1, Slipchenko E.A.1, Kornilova D.S.1, Tsygankova M.V.1, Shvets V.I.1
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Мекемелер:
- Institute of Fine Chemical Technologies
- Шығарылым: Том 63, № 9 (2018)
- Беттер: 1236-1242
- Бөлім: Physical Chemistry of Solutions
- URL: https://journals.rcsi.science/0036-0236/article/view/168996
- DOI: https://doi.org/10.1134/S0036023618090024
- ID: 168996
Дәйексөз келтіру
Аннотация
A model of the chemical interaction of Si with the (HF2)– ion was propsoed to explain some experimental data on the formation of porous silicon.
Авторлар туралы
E. Abramova
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, Moscow, 119571
A. Khort
Institute of Fine Chemical Technologies
Хат алмасуға жауапты Автор.
Email: anavenko@yandex.ru
Ресей, Moscow, 119571
A. Yakovenko
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, Moscow, 119571
E. Slipchenko
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, Moscow, 119571
D. Kornilova
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, Moscow, 119571
M. Tsygankova
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, Moscow, 119571
V. Shvets
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, Moscow, 119571
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