X-Ray Diffraction Studies of Metallic Palladium-Based Foil Filters Using Synchrotron Radiation
- Авторлар: Akimova O.V.1, Veligzhanin A.A.2
-
Мекемелер:
- Faculty of Physics, Moscow State University
- Russian Research Center “Kurchatov Institute”
- Шығарылым: Том 119, № 9 (2018)
- Беттер: 837-841
- Бөлім: Structure, Phase Transformations, and Diffusion
- URL: https://journals.rcsi.science/0031-918X/article/view/167785
- DOI: https://doi.org/10.1134/S0031918X18090028
- ID: 167785
Дәйексөз келтіру
Аннотация
This paper presents the results of the study of the long-term relaxation states of metallic palladium-based foil filters (Pd, 9.6 at %; Y and Pd, 5.3 at %; In, 0.5 at %; Ru) after hydrogenation (82 000 and 58 500 h, respectively) using X-ray diffraction and synchrotron radiation (SR). We analyzed the normalized integral intensities of diffraction maxima for two orders of reflections from coherent scattering regions (CSRs) along crystallographic directions [111] and [100].
Негізгі сөздер
Авторлар туралы
O. Akimova
Faculty of Physics, Moscow State University
Хат алмасуға жауапты Автор.
Email: akimova@physics.msu.ru
Ресей, Moscow, 119991
A. Veligzhanin
Russian Research Center “Kurchatov Institute”
Email: akimova@physics.msu.ru
Ресей, Moscow, 123182
Қосымша файлдар
