Modification of the structure of surface layers of commercial titanium in the process of treatment by low-energy high-current electron beams


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Abstract

Methods of optical, atomic-force, and transmission and scanning electron microscopy, as well as X-ray diffraction analysis have been used to study the effect of electron-beam treatment on the surface morphology and structure of titanium of grade VT1-0. It has been shown that irradiation by three electron pulses with an energy density in the beam of W = 12–24 J/cm2 and a pulse duration of 50 μs leads to the formation of VT1-0 samples of a multilayer structure in the surface layers that consist of fine particles of the α phase, which have a subgrain structure, and of the underlying coarse grains, which contain α’ martensitic phase. The influence of the density of energy of the electron beam on the hardness and the magnitude of microand macrostresses that develop in the modified surface layer has been demonstrated. The results of calculating the thermal fields that appear in the process of treatment by electron beam are presented.

About the authors

A. V. Panin

Institute of Strength Physics and Materials Science, Siberian Branch; Tomsk National Research Polytechnic University

Author for correspondence.
Email: pav@ispms.tsc.ru
Russian Federation, pr. Akademicheskii 2/4, Tomsk, 634055; pr. Lenina 30, Tomsk, 634050

M. S. Kazachenok

Institute of Strength Physics and Materials Science, Siberian Branch

Email: pav@ispms.tsc.ru
Russian Federation, pr. Akademicheskii 2/4, Tomsk, 634055

O. M. Borodovitsina

Institute of Strength Physics and Materials Science, Siberian Branch; Tomsk National Research Polytechnic University

Email: pav@ispms.tsc.ru
Russian Federation, pr. Akademicheskii 2/4, Tomsk, 634055; pr. Lenina 30, Tomsk, 634050

O. B. Perevalova

Institute of Strength Physics and Materials Science, Siberian Branch

Email: pav@ispms.tsc.ru
Russian Federation, pr. Akademicheskii 2/4, Tomsk, 634055

O. M. Stepanova

Tomsk National Research Polytechnic University

Email: pav@ispms.tsc.ru
Russian Federation, pr. Lenina 30, Tomsk, 634050

Yu. F. Ivanov

Tomsk National Research Polytechnic University; Institute of High-Current Electronics, Siberian Branch

Email: pav@ispms.tsc.ru
Russian Federation, pr. Lenina 30, Tomsk, 634050; pr. Akademicheskii 2/3, Tomsk, 634055


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