Studying the Internal Structure of Microcavities by Means of Optical Tomography


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Abstract

A microscope for studying internal inhomogeneities of the refractive index of optical dielectric microcavities by optical tomography is developed. The influence of these inhomogeneities on the Q factor of optical dielectric microcavities formed by thermal treatment is experimentally studied.

About the authors

G. G. Levin

All-Russian Research Institute for Optical and Physical Measurements

Email: minaev@vniiofi.ru
Russian Federation, Moscow, 119361

V. L. Minaev

All-Russian Research Institute for Optical and Physical Measurements

Author for correspondence.
Email: minaev@vniiofi.ru
Russian Federation, Moscow, 119361

K. N. Min’kov

All-Russian Research Institute for Optical and Physical Measurements; Tikhonov Moscow Institute of Electronics and Mathematics, National Research University Higher School of Economics

Email: minaev@vniiofi.ru
Russian Federation, Moscow, 119361; Moscow, 101000

M. M. Ermakov

All-Russian Research Institute for Optical and Physical Measurements

Email: minaev@vniiofi.ru
Russian Federation, Moscow, 119361

A. A. Samoilenko

All-Russian Research Institute for Optical and Physical Measurements

Email: minaev@vniiofi.ru
Russian Federation, Moscow, 119361

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