Email this article An Interferometric Method of Measuring Reflection Coefficients
- Authors: Kovalyov A.A.1
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Affiliations:
- Rzhanov Institute of Semiconductor Physics, Siberian Branch
- Issue: Vol 124, No 6 (2018)
- Pages: 850-854
- Section: Physical Optics
- URL: https://journals.rcsi.science/0030-400X/article/view/165726
- DOI: https://doi.org/10.1134/S0030400X18060139
- ID: 165726
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Abstract
A method for determining the reflection coefficients of optical elements, which is based on the use of a reflection interferometer, is proposed. The results of measurements with a He–Ne laser for several samples with different reflectivity levels are presented. Comparison with results of conventional measurements is made. The gain from the use of the reflection interferometer is estimated.
About the authors
A. A. Kovalyov
Rzhanov Institute of Semiconductor Physics, Siberian Branch
Author for correspondence.
Email: kovalev@isp.nsc.ru
Russian Federation, Novosibirsk, 630090
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