Determination of optical constants of a biaxially anisotropic film by standard multiangle monochromatic ellipsometry

Abstract

Possibilities of standard multiangle monochromatic ellipsometry in the determination of parameters of a uniform biaxially anisotropic layer are studied for the case of an arbitrary orientation of the two principal axes in the plane of incidence of the light beam and perpendicularity of the third axis to the plane of incidence. Using numerical simulation, it has been found that the measurement accuracy that is necessary in the determination of all the three principal components of the dielectric permittivity tensor ε and tilt angle of the axes using only angular dependences of ellipsometric parameters must be no worse than 0.0001°, which is far beyond the accuracy limits provided by present-day ellipsometers. If the tilt angle is known, standard multiangle monochromatic ellipsometry provides the determination of thickness and all three principal components of the dielectric permittivity tensor. This method allows one to determine the layer thickness and tensor component for the axis perpendicular to the plane of incidence, as well as the average value of components for the axes lying in the plane of incidence without involving the data about the tilt angle of the axes. This is demonstrated by an example of experimental data for biaxially anisotropic SiO_x films obtained by oblique deposition of silicon monoxide SiO evaporated in vacuum.