Modeling of the Risk of Single Event Upsets from Cosmic Particles for Memory with Error Correction

Abstract

In this study a risk of single event upsets from cosmic particles for computer memory with error correction onboard spacecraft is modeled. A brief description of existing mechanisms of the detection and correction of errors in memory is given. Formulas for calculating the probability of occurring of >1, 2 and so on errors in at least one memory block are presented. Values of the probability of uncorrectable errors for the concrete conditions of spacecraft flight are computed for certain microchips.