Determination of surface-layer parameters on pure liquids via ellipsometry

Abstract

In this work we describe a method for evaluating such parameters of an interfacial layer as the refractive index and thickness of the liquid–vapor interface, based on the measured ellipticity coefficient, ρ, at different wavelengths of the probing light and the data [1] for several pure fluids. In particular, the change in the main angle of incidence was evaluated in the “layer on the substrate” structure. The surface layer is assumed to be homogeneous.