Experimental-Theoretical Approach to Determining the Film–Substrate Adhesion

Abstract

There are well-known methods and algorithms for determining the film adhesion to a plane substrate, which have their own advantages and drawbacks and the applicability ranges. The substrates can have a good initial shape (spherical, cylindrical, etc,) covered, for example, by a thin film layer. But there are practically no studies of the film adhesion to a substrate with a nonplane surface. A two-dimensional approach to determining the film adhesion to a plane or a nonplane substate is developed, which permits increasing the accuracy of determining the adhesion and decreasing the scattering of the obtained results. An example is considered.