Kristallografiâ
ISSN 0023-4761 (Print)
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ABSOLUTE CONFIGURATION
CHIRAL CRYSTALS
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DEFECT STRUCTURE
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Pd–11.3 at. % W ALLOY
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ABSOLUTE CONFIGURATION
CHIRAL CRYSTALS
CRYSTAL STRUCTURE
CRYSTALS
Co/Pt MULTILAYER STRUCTURES
DEFECT STRUCTURE
FARADAY ROTATION
HISTORY OF X-RAY STRUCTURAL STUDIES
IONIC CONDUCTIVITY
KIESSIG OSCILLATIONS
MARTENSITE TRANSFORMATIONS
MECHANOCOMPOSITES
MÖSSBAUER SPECTROSCOPY
Pd–11.3 at. % W ALLOY
SMALL-ANGLE X-RAY SCATTERING
STRUCTURE
SYNCHROTRON RADIATION
TENSOR APPROACH
THREE-WAVE X-RAY DIFFRACTION
ULTRAFAST MAGNETIC DYNAMICS
X-RAY DIFFRACTION
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Author Details
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Koshelev, I. O.
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Vol 69, No 2 (2024)
ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ
Thin textured CdTe films on silicon and sapphire substrates: thermal vapor deposition and structural characterization
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