Conduction band electronic states of ultrathin furan-phenylene co-oligomer on the surfaces of oxidized silicon and of layer-by-layer grown zinc oxide

А. S. Komolov; Комолов А. С.; I. A. Pronin; Пронин И. А.; Е. F. Lazneva; Лазнева Э. Ф.; V. S. Sobolev; Соболев В. С.; E. A. Dubov; Дубов Е. А.; A. A. Komolova; Комолова А. А.; Е. V. Zhizhin; Жижин Е. В.; D. A. Pudikov; Пудиков Д. А.; S. A. Pshenichnyuk; Пшеничнюк С. А.; Ch. S. Becker; Беккер К. С.; M. S. Kazantsev; Казанцев М. С.; F. Dj. Akbarova; Акбарова Ф. Дж.; U. B. Sharopov; Шаропов У. Б.

doi:10.31857/S0023476124040139

Conduction band electronic states of ultrathin furan-phenylene co-oligomer on the surfaces of oxidized silicon and of layer-by-layer grown zinc oxide

Authors: Komolov А.S.¹, Pronin I.A.², Lazneva Е.F.¹, Sobolev V.S.¹, Dubov E.A.¹, Komolova A.A.¹, Zhizhin Е.V.¹, Pudikov D.A.¹, Pshenichnyuk S.A.³, Becker C.S.⁴, Kazantsev M.S.⁴, Akbarova F.D.⁵, Sharopov U.B.⁵^,6
Affiliations:
1. St. Petersburg State University
2. Penza State University
3. Institute of Molecule and Crystal Physics, Ufa Federal Research Centre, Russian Academy of Sciences
4. N. N. Vorozhtsov Novosibirsk Institute of Organic Chemistry, Siberian Branch of Russian Academy of Sciences
5. Physical-Technical Institute, Uzbekistan Academy of Sciences
6. Bukhara State University
Issue: Vol 69, No 4 (2024)
Pages: 670-675
Section: НАНОМАТЕРИАЛЫ, КЕРАМИКА
URL: https://journals.rcsi.science/0023-4761/article/view/264421
DOI: https://doi.org/10.31857/S0023476124040139
EDN: https://elibrary.ru/XCDNNL
ID: 264421

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Abstract

The paper reports on results of an investigation of the electronic states of the conduction band of ultrathin films of furan-phenylene co-oligomer 1,4-bis(5-phenylfuran-2-yl)benzene (FP5) and the results of an investigation of the interfacial potential barrier upon the formation of these films on the surfaces of (SiO₂)n-Si and of layer-by-layer deposited ZnO. Upon deposition of an 8–10 nm thick FP5 film, the total current spectroscopy (TCS) technique was used for investigation within the energy range from 5 eV to 20 eV above EF. FP5 films on the (SiO₂)n-Si surface showed a domain structure with a characteristic domain size of the order of 1 micro.m × 1 micro.m and a surface roughness within the domain under 1 nm. In contrast, FP5 on the ZnO surface showed a granular structure with a grain height of 40–50 nm.

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Conduction band electronic states of ultrathin furan-phenylene co-oligomer on the surfaces of oxidized silicon and of layer-by-layer grown zinc oxide

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Abstract

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