Growth of Ferroelectric Domains in Polar Direction

V. Ya. Shur; Шур В. Я.; E. V. Pelegova; Пелегова Е. В.; A. P. Turygin; Турыгин А. П.; M. S. Kosobokov; Кособоков М. С.; Yu. M. Alikin; Аликин Ю. М.

doi:10.31857/S0023476123600611

Growth of Ferroelectric Domains in Polar Direction

作者: Shur V.¹, Pelegova E.¹, Turygin A.¹, Kosobokov M.¹, Alikin Y.¹
隶属关系:
1. Institute of Natural Sciences and Mathematics, Ural Federal University, 620002, Yekaterinburg, Russia
期: 卷 68, 编号 5 (2023)
页面: 767-775
栏目: ФИЗИЧЕСКИЕ СВОЙСТВА КРИСТАЛЛОВ
URL: https://journals.rcsi.science/0023-4761/article/view/137421
DOI: https://doi.org/10.31857/S0023476123600611
EDN: https://elibrary.ru/ECXUGO
ID: 137421

如何引用文章

全文:

开放存取

##reader.subscriptionAccessGranted##
受限制的访问

订阅存取

详细
作者简介
参考
补充文件
统计

详细

The forward domain growth in polar direction has been investigated on the example of the formation of isolated wedge-shaped domains and arrays of domains on lithium niobate nonpolar cuts under an electric field of a scanning probe microscope. Domain growth occurs due to the generation of steps and motion of charged kinks along charged domain walls (CDWs). A simulation of field spatial distribution showed that the generation of steps near a domain vertex is mainly caused by the effect of external field, whereas the forward growth is due to the kink motion in the field induced by neighboring kinks. Scanning by a probe tip with an applied voltage leads to the self-assembled formation of domain arrays with domain length alternation: doubling, quadrupling, and chaotic behavior under the action of the depolarizing fields formed by three neighboring domains.

参考

Tagantsev A.K., Cross L.E., Fousek J. Domains in ferroic crystals and thin films. Berlin: Springer, 2010. 822 p. https://doi.org/10.1007/978-1-4419-1417-0
Newnham R.E., Miller C.S., Cross L.E. et al. // Phys. Status Solidi. 1975. V. 32. P. 69. https://doi.org/10.1002/pssa.2210320107
Wada S. // Ferroelectrics. 2009. V. 389. P. 3. https://doi.org/10.1080/00150190902987335
Shur V.Ya. // Advanced piezoelectric materials / Ed. Uchino K. Cambridge: Woodhead Publishing, 2017. P. 235. https://doi.org/10.1016/B978-0-08-102135-4.00006-0
Fejer M.M., Magel G.A., Jundt D.H. et al. // IEEE J. Quantum Electron. 1992. V. 28. P. 2631. https://doi.org/10.1109/3.161322
Hum D.S., Fejer M.M. // C. R. Phys. 2007. V. 8. P. 180. https://doi.org/10.1016/j.crhy.2006.10.022
Shur V.Ya., Rumyantsev E.L., Nikolaeva E.V. et al. // Ferroelectrics. 2000. V. 236. P. 129. https://doi.org/10.1080/00150190008016047
Shur V.Ya., Akhmatkhanov A.R., Baturin I.S. // Appl. Phys. Rev. 2015. V. 2. P. 040604. https://doi.org/10.1063/1.4928591
Классен-Неклюдова М.В., Чернышева М.А., Штернберг А.А. // Докл. АН СССР. 1948. Т. 18. С. 527.
Matthias B., von Hippel A. // Phys. Rev. 1948. V. 73. P. 1378. https://doi.org/10.1103/PhysRev.73.1378
Merz W.J. // Phys. Rev. 1954. V. 95. P. 690. https://doi.org/10.1103/PhysRev.95.690
Little E.A. // Phys. Rev. 1955. V. 98. P. 978. https://doi.org/10.1103/PhysRev.98.978
Le Bihan R. // Ferroelectrics. 1988. V. 97. P. 19. https://doi.org/10.1080/00150198908018081
Gruverman A., Auciello O., Tokumoto H. // Annu. Rev. Mater. Sci. 1998. V. 28. P. 101. https://doi.org/10.1146/annurev.matsci.28.1.101
Kholkin A.L., Kalinin S.V., Roelofs A., Gruverman A. // Scanning probe microscopy / Eds. Kalinin S., Gruverman A. New York: Springer, 2007. P. 173. https://doi.org/10.1007/978-0-387-28668-6_7
Shur V.Ya. // Handbook of Advanced Dielectric, Piezoelectric and Ferroelectric Materials – Synthesis, Characterization and Applications / Ed. Ye G.-Z. Cambridge: Woodhead Publishing, 2008. P. 622.
Gopalan V., Mitchell T.E. // J. Appl. Phys. 1998. V. 83. P. 941. https://doi.org/10.1063/1.366782
Shur V.Ya., Lobov A.I., Shur A.G. et al. // Appl. Phys. Lett. 2005. V. 87. P. 022905. https://doi.org/10.1063/1.1993769
Alikin D.O., Ievlev A.V., Turygin A.P. et al. // Appl. Phys. Lett. 2015. V. 106. P. 182902. https://doi.org/10.1063/1.4919872
Zalessky V.G., Fregatov S.O. // Phys. B. Condens. Matter. 2006. V. 371. P. 158. https://doi.org/10.1016/j.physb.2005.10.097
Kokhanchik L.S., Borodin M.V., Shandarov S.M. et al. // Phys. Solid State. 2010. V. 52. P. 1722. https://doi.org/10.1134/S106378341008024X
Volk T.R., Kokhanchik L.S., Gainutdinov R.V. et al. // Ferroelectrics. 2016. V. 500. P. 129. https://doi.org/10.1080/00150193.2016.1214527
Ievlev A.V., Alikin D.O., Morozovska A.N. et al. // ACS Nano. 2015. V. 9. P. 769. https://doi.org/10.1021/nn506268g
Turygin A.P., Alikin D.O., Alikin Yu.M. et al. // Materials. 2017. V. 10. P. 1143. https://doi.org/10.3390/ma10101143
Lilienblum M., Soergel E. // J. Appl. Phys. 2011. V. 110. P. 052018. https://doi.org/10.1063/1.3623775
Bühlmann S., Colla E., Muralt P. // Phys. Rev. B. 2005. V. 72. P. 214120. https://doi.org/10.1103/PhysRevB.72.214120
Turygin A.P., Alikin D.O., Kosobokov M.S. et al. // ACS Appl. Mater. Interfaces. 2018. V. 10. P. 36211. https://doi.org/10.1021/acsami.8b10220
Ievlev A.V., Morozovska A.N., Eliseev E.A. et al. // Nat. Commun. 2014. V. 5. P. 4545. https://doi.org/10.1038/ncomms5545
Kim Y., Bühlmann S., Hong S. et al. // Appl. Phys. Lett. 2007. V. 90. P. 072910. https://doi.org/10.1063/1.2679902
Abplanalp M., Fousek J., Günter P. // Phys. Rev. Lett. 2001. V. 86. P. 5799. https://doi.org/10.1103/PhysRevLett.86.5799
Ievlev A.V., Morozovska A.N., Shur V.Ya. et al. // Phys. Rev. B. 2015. V. 91. P. 214109. https://doi.org/10.1103/PhysRevB.91.214109
Shur V.Ya., Rumyantsev E.L., Nikolaeva E.V. et al. // Appl. Phys. Lett. 2000. V. 76. P. 143. https://doi.org/10.1063/1.125683
Shur V.Ya., Rumyantsev E.L., Batchko R.G. et al. // Phys. Solid State 1999. V. 41. P. 1681. https://doi.org/0.1134/1.1131068
Muller M., Soergel E., Buse K. // Opt. Lett. 2003. V. 28. P. 2515. https://doi.org/0.1134/1.1131068
Molotskii M., Agronin A., Urenski P. et al. // Phys. Rev. Lett. 2003. V. 90. P. 107601. https://doi.org/10.1103/PhysRevLett.90.107601
Molotskii M., Rosenwaks Y., Rosenman G. // Annu. Rev. Mater. Res. 2007. V. 37. P. 271. https://doi.org/10.1146/annurev.matsci.37.052506.084223
Shur V.Ya., Rumyantsev E.L., Nikolaeva E.V. et al. // Appl. Phys. Lett. 2000. V. 77. P. 3636. https://doi.org/10.1063/1.1329327
Sluka T., Tagantsev A.K., Bednyakov P. et al. // Nat. Commun. 2013. V. 4. P. 1808. https://doi.org/10.1038/ncomms2839
Campbell M.P., McConville J.P.V., McQuaid R.G.P. et al. // Nat. Commun. 2016. V. 7. P. 13764. https://doi.org/10.1038/ncomms13764
Esin A.A., Akhmatkhanov A.R., Shur V.Ya. // Appl. Phys. Lett. 2019. V. 114. P. 092901. https://doi.org/10.1063/1.5079478
Pertsev N.A., Kholkin A.L. // Phys. Rev. B. 2013. V. 88. P. 174109. https://doi.org/10.1103/PhysRevB.88.174109
Agronin A., Molotskii M., Rosenwaks Y. et al. // J. Appl. Phys. 2006. V. 99. P. 104102. https://doi.org/10.1063/1.2197264
Shur V.Ya., Ievlev A.V., Nikolaeva E.V. et al. // J. Appl. Phys. 2011. V. 110. P. 052017. https://doi.org/10.1063/1.3624798
Shur V.Ya. // Nucleation theory and applications / Ed. Schmelzer J.W.P. Weinheim: Wiley-VCH, 2005. P. 178. https://doi.org/10.1002/3527604790.ch6
Shur V.Ya. // J. Mater. Sci. 2006. V. 41. P. 199. https://doi.org/10.1007/s10853-005-6065-7
Agronin A., Molotskii M., Rosenwaks Y. et al. // J. Appl. Phys. 2006. V. 99. P. 104102. https://doi.org/10.1063/1.2197264
Greshnyakov E.D., Turygin A.P., Pryakhina V.I. et al. // J. Appl. Phys. 2022. V. 131. P. 214103. https://doi.org/10.1063/5.0093200
Fatuzzo E., Merz W.J. Ferroelectricity. Amsterdam: North-Holland Publishing Company, 1967. P. 289.
Miller R.C., Weinreich G. // Phys. Rev. 1960. V. 117. P. 1460. https://doi.org/10.1103/PhysRev.117.1460
Cahn J.W. // Acta Metall. 1960. V. 8. P. 554. https://doi.org/10.1016/0001-6160(60)90110-3
Shur V.Ya. // Ferroelectric thin films: synthesis and basic properties / Eds. Paz de Araujo C.A. et al. Amsterdam: Gordon & Breach Science Publishers, 1996. P. 153.
Marwan N., Romano M.C., Thiel M. et al. // Phys. Rep. 2007. V. 438. P. 237. https://doi.org/10.1016/j.physrep.2006.11.001