X-RAY REFLECTOMETRY OF THIN FILMS FORMED DURING PHASE SEPARATION OF ORGANIC SOLUTIONS OF ALIPHATIC POLYETHERS IN WATER
- Autores: Asadchikov V.1, Volkov Y.1, Roshchin B.1, Nuzhdin A.1, Chernavskay E.2, Tikhonov A.3, Mironov A.1, Mariyanac A.1, Popov V.1
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Afiliações:
- Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
- National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow, 115409 Russia
- Kapitza Institute for Physical Problems, Russian Academy of Sciences, Moscow, 119334 Russia
- Edição: Volume 68, Nº 1 (2023)
- Páginas: 94-99
- Seção: ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ
- URL: https://journals.rcsi.science/0023-4761/article/view/137373
- DOI: https://doi.org/10.31857/S0023476123010022
- EDN: https://elibrary.ru/DMWVLY
- ID: 137373
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Resumo
The possibilities of X-ray reflectometry for studying the structure of planar liquid-phase membranes are demonstrated by the example of polyester films formed on the surface of deionized water from solutions of polylactoglycolide (PLG) in chloroform and tetraglycol (TG). It is found that the use of solutions with PLG concentrations ranging from 1 to 4 wt % or above 6 wt % leads to a proportional increase in the density of these films with preservation of their structure and thickness up to 25 Å. At a PLG concentration close to 5 wt % the PLG/TG system transits to an unstable state, characterized by intense penetration of PLG aliphatic chains into the water substrate bulk to a depth up to 100 Å.
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Sobre autores
V. Asadchikov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
Email: asad@crys.ras.ru
Россия, Москва
Yu. Volkov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
Email: asad@crys.ras.ru
Россия, Москва
B. Roshchin
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
Email: asad@crys.ras.ru
Россия, Москва
A. Nuzhdin
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
Email: asad@crys.ras.ru
Россия, Москва
E. Chernavskay
National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow, 115409 Russia
Email: asad@crys.ras.ru
Россия, Москва
A. Tikhonov
Kapitza Institute for Physical Problems, Russian Academy of Sciences, Moscow, 119334 Russia
Email: asad@crys.ras.ru
Россия, Москва
A. Mironov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
Email: asad@crys.ras.ru
Россия, Москва
A. Mariyanac
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
Email: asad@crys.ras.ru
Россия, Москва
V. Popov
Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia
Autor responsável pela correspondência
Email: asad@crys.ras.ru
Россия, Москва
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