The use of 2D diffractometry data for oriented samples in the choice of a unit cell
- Authors: Sukhikh A.S.1,2, Basova T.V.1,2, Gromilov S.A.1,2
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Affiliations:
- Nikolaev Institute of Inorganic Chemistry, Siberian Branch
- Novosibirsk National Research State University
- Issue: Vol 58, No 5 (2017)
- Pages: 953-963
- Section: Article
- URL: https://journals.rcsi.science/0022-4766/article/view/161501
- DOI: https://doi.org/10.1134/S0022476617050146
- ID: 161501
Cite item
Abstract
An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.
About the authors
A. S. Sukhikh
Nikolaev Institute of Inorganic Chemistry, Siberian Branch; Novosibirsk National Research State University
Author for correspondence.
Email: a_sukhikh@niic.nsc.ru
Russian Federation, Novosibirsk; Novosibirsk
T. V. Basova
Nikolaev Institute of Inorganic Chemistry, Siberian Branch; Novosibirsk National Research State University
Email: a_sukhikh@niic.nsc.ru
Russian Federation, Novosibirsk; Novosibirsk
S. A. Gromilov
Nikolaev Institute of Inorganic Chemistry, Siberian Branch; Novosibirsk National Research State University
Email: a_sukhikh@niic.nsc.ru
Russian Federation, Novosibirsk; Novosibirsk
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